Coupling mechanisms in exchange biased films (invited)

Citation
Tc. Schulthess et Wh. Butler, Coupling mechanisms in exchange biased films (invited), J APPL PHYS, 85(8), 1999, pp. 5510-5515
Citations number
31
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2B
Pages
5510 - 5515
Database
ISI
SICI code
0021-8979(19990415)85:8<5510:CMIEBF>2.0.ZU;2-X
Abstract
We use an atomistic Heisenberg model in conjunction with the classical Land au Lifshitz equation for the spin motion to study coupling mechanisms betwe en ferromagnetic (FM) and antiferromagnetic (AFM) films. Calculations for C oO/FM illustrate that there are two coupling mechanisms at work, the spin-f lop coupling and an AFM-FM coupling through uncompensated defects. While th e latter accounts for exchange bias and related phenomena, the former gives rise to a large coercivity and perpendicular alignment between FM spins an d AFM easy axis. A combination of the two mechanisms explains apparent disc repancies between reversible and irreversible measurements of the AFM-FM co upling. (C) 1999 American Institute of Physics. [S0021-8979(99)31508-5].