Kerr effect observations of magnetization reversal process in antiferromagnetically pinned permalloy thin films

Citation
Zh. Qian et al., Kerr effect observations of magnetization reversal process in antiferromagnetically pinned permalloy thin films, J APPL PHYS, 85(8), 1999, pp. 5525-5527
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2B
Pages
5525 - 5527
Database
ISI
SICI code
0021-8979(19990415)85:8<5525:KEOOMR>2.0.ZU;2-W
Abstract
In this article, the magnetization reversal process for antiferromagnetic ( AFM) materials (NiO, FeMn, and NiMn) coupled to NiFe permalloy thin films h ave been investigated. The nature of the effect of exchange coupling on the reversal of the AFM-pinned permalloy was observed using the magneto-optic Kerr effect. These studies indicated that the reversal process appears as w idespread nucleation of 1-10 mu m sized reversal domains over the entire ar ea of the film with subsequent domain expansion and coalescence. Interpreta tion of the magnetization reversal process requires an understanding of the exchange coupling mechanism. It is believed that the magnetization reversa l process observed here is dominated by a nucleation-rotation mechanism in which the interfacial spin system is highly uniform. The exact nature of th e spin reversal nucleation process is not fully understood but appears to a rise from weak localized pinning states. (C) 1999 American Institute of Phy sics. [S0021-8979(99)31708-4].