Origins of perpendicular magnetic anisotropy in Ni/Pd multilayer films

Citation
Jr. Jeong et al., Origins of perpendicular magnetic anisotropy in Ni/Pd multilayer films, J APPL PHYS, 85(8), 1999, pp. 5762-5764
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2B
Pages
5762 - 5764
Database
ISI
SICI code
0021-8979(19990415)85:8<5762:OOPMAI>2.0.ZU;2-V
Abstract
Room-temperature perpendicular magnetic anisotropy (PMA) was observed in Ni /Pd multilayer films having 5.1-11 Angstrom Ni and constant 5.7 Angstrom Pd sublayer thicknesses, prepared by dc magnetron sputtering at 7 mTorr Ar sp uttering pressure. The magnetoelastic anisotropy determined from delicate i n situ stress and ex situ magnetostriction coefficient measurements was fou nd to contribute positively to the observed PMA in those samples and its ma gnitude was nearly comparable to the surface anisotropy. (C) 1999 American Institute of Physics. [S0021-8979(99)46208-5].