Propagation of the magnetic domain wall in submicron magnetic wire investigated by using giant magnetoresistance effect

Authors
Ono, T Miyajima, H Shigeto, K Mibu, K Hosoito, N Shinjo, T
Citation
T. Ono et al., Propagation of the magnetic domain wall in submicron magnetic wire investigated by using giant magnetoresistance effect, J APPL PHYS, 85(8), 1999, pp. 6181-6183
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2B
Pages
6181 - 6183
Database
ISI
SICI code
0021-8979(19990415)85:8<6181:POTMDW>2.0.ZU;2-G
Abstract
The magnetization reversal phenomenon in a submicron magnetic wire with a t rilayer structure consisting of NiFe(400 Angstrom)/Cu(200 Angstrom)/NiFe(50 Angstrom) was investigated by measuring the electric resistance in externa l magnetic fields. It is shown that the magnetization reversal can be very sensitively investigated by utilizing the giant magnetoresistance effect. T he time variation of resistance during the magnetization reversal was also measured and the velocity of the magnetic domain wall propagating in the wi re was determined at 77 K. (C) 1999 American Institute of Physics. [S0021-8 979(99)69808-5].