Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films

Citation
Zs. Shan et al., Effects of layer thickness on orientation distribution and magnetic properties of CoCrTa/Cr films, J APPL PHYS, 85(8), 1999, pp. 4310-4312
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2A
Pages
4310 - 4312
Database
ISI
SICI code
0021-8979(19990415)85:8<4310:EOLTOO>2.0.ZU;2-G
Abstract
Evolution of orientation distribution of Co(110) crystal planes was determi ned by x-ray rocking curves. It has been found that: (i) The full-width at half maximum W of the Co(110) rocking curve decreases with both increasing Cr underlayer thickness d(Cr), and increasing CoCrTa magnetic layer thickne ss d(Co), especially in the thin layer regime. (ii) For the thin d(Co) regi me, the interlayer diffusion between the Cr underlayer and the magnetic lay er affects the rocking curves and magnetic properties significantly. (iii) Film magnetic properties, e.g., a significant jump in coercivity with incre asing magnetic layer thickness in the thin d(Co) regime may be related in p art to the evolution of the Co(110) orientation distribution. (C) 1999 Amer ican Institute of Physics. [S0021-8979(99)60608-9].