A large value of giant magnetoresistance Delta R/R=9% with an exchange fiel
d H-ex = 350 Oe has been measured from simple NiFe/CoFe/Cu/CoFe/IrMn top sp
in-valve films prepared by ion beam deposition (IBD) techniques. The exchan
ge biasing was greatly enhanced when a synthetic pinned layer, CoFe/Ru/CoFe
, is used in the spin-valve structures. Apparent exchange field values in e
xcess of 2000 Oe and Delta R/R values above 8% have been obtained in synthe
tic spin-valve films. These IBD spin-valve films show excellent thermal sta
bility and they are suitable for the applications in high density magnetic
recording heads. (C) 1999 American Institute of Physics. [S0021-8979(99)347
08-3].