Mr. Pufall et al., Layer-resolved magnetometry of a magnetic bilayer using the magnetoopticalKerr effect with varying angle of incidence, J APPL PHYS, 85(8), 1999, pp. 4818-4820
We determined the hysteresis loop of each layer in a magnetic bilayer of Ni
Fe-SiO2-CoFe using the magneto-optical Kerr effect. Our method utilizes the
fact that varying the angle of incidence of the optical beam changes the m
agnitude and sign of the polarization rotation signal contributed by each l
ayer to the total signal. The magneto-optical signal of each layer varies d
ifferently with the angle of incidence, enabling us to determine the hyster
esis loop of each. We measured the hysteresis loop of the bilayer for a ran
ge of angles of incidence, and from these loops determined the magnetizatio
n of the individual layers. We found that the magnetization of the soft NiF
e layer coupled strongly to the CoFe layer for SiO2 interlayer thicknesses
of <2 nm. The NiFe loop shears with decreasing interlayer thickness, increa
ses in coercivity, and develops a two-stage switching behavior at an interl
ayer thickness of 1 nm. (C) 1999 American Institute of Physics. [S0021-8979
(99)65908-4].