The orientation of the magnetization and the occurrence of interfacial ferr
omagnetic dead layers for ultrathin Co films on Si(111) and CoSi2 surfaces
have been systematically studied using in situ surface magnetic-optic Kerr
effect. We have experimentally demonstrated that an in-plane magnetization
can be obtained by using CoSi2 as a buffer layer for ultrathin Co films bet
ween 2.8 and 10.5 monolayers (MLs) deposited on Si(111) at 300 K. The ferro
magnetic dead layers at the interface are most likely due to the formation
of a Co-Si alloy. This region can be reduced from 2.1 to 1.4 ML by lowering
the substrate temperature from 300 to 120 K. From a dynamic study of the s
ilicide formation in Co/Si(111), a two-step diffusion mechanism is suggeste
d with two different diffusion activation energies of the Co atoms resultin
g from different chemical environments. (C) 1999 American Institute of Phys
ics. [S0021-8979(99)78308-8].