Dynamic coercivity measurements in thin film recording media using a contact write/read tester

Citation
A. Moser et al., Dynamic coercivity measurements in thin film recording media using a contact write/read tester, J APPL PHYS, 85(8), 1999, pp. 5018-5020
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2A
Pages
5018 - 5020
Database
ISI
SICI code
0021-8979(19990415)85:8<5018:DCMITF>2.0.ZU;2-P
Abstract
Thermally activated magnetization reversal processes become manifest in the dependence of the remanent coercivity on the time during which a magnetic field is applied opposite to the initial magnetization direction. They have important consequences for the long term stability and short time writeabi lity of future high density recording media. In this paper, we report on a new experiment using a contact write/read tester to study the time dependen ce of the remanent coercivity over more than 10 orders of magnitude (from 6 ns to >60 s). Remanence coercivity and signal decay measurements of a CoPt Cr recording medium with 5.5 nm thickness are presented. (C) 1999 American Institute of Physics. [S0021-8979(99)62908-5].