Rotational transverse magnetometry (RTM) is used to measure the anisotropy
field of magnetic thin films. Magnetization reversal during rotation of a t
wo-dimensional isotropic sample in an applied field is discussed. The relat
ion between the transverse magnetization M-y and the applied field H is sol
ved numerically. An excellent approximation for the transverse magnetizatio
n is M-y/M-s = A(1-H/H-k)(2.5), where A = 1.1434, and H-k is the anisotropy
field. For curve fitting to experimental data, both A and H-k were used as
fitting parameters. Comparison between a constructed torque hysteresis met
hod and this vibrating sample magnetometer (VSM) RTM method is made theoret
ically and experimentally. Both results show that the VSM RTM will give a g
ood extrapolation of the anisotropy field, whereas the torque measurement w
ill slightly overestimate it. Anisotropy energy is calculated based on the
anisotropy field and saturation magnetization for magnetic thin films. (C)
1999 American Institute of Physics. [S0021-8979(99)29508-4].