Use of rotational transverse magnetometry to measure anisotropy energy

Authors
Citation
N. Li et Bm. Lairson, Use of rotational transverse magnetometry to measure anisotropy energy, J APPL PHYS, 85(8), 1999, pp. 5142-5144
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2A
Pages
5142 - 5144
Database
ISI
SICI code
0021-8979(19990415)85:8<5142:UORTMT>2.0.ZU;2-6
Abstract
Rotational transverse magnetometry (RTM) is used to measure the anisotropy field of magnetic thin films. Magnetization reversal during rotation of a t wo-dimensional isotropic sample in an applied field is discussed. The relat ion between the transverse magnetization M-y and the applied field H is sol ved numerically. An excellent approximation for the transverse magnetizatio n is M-y/M-s = A(1-H/H-k)(2.5), where A = 1.1434, and H-k is the anisotropy field. For curve fitting to experimental data, both A and H-k were used as fitting parameters. Comparison between a constructed torque hysteresis met hod and this vibrating sample magnetometer (VSM) RTM method is made theoret ically and experimentally. Both results show that the VSM RTM will give a g ood extrapolation of the anisotropy field, whereas the torque measurement w ill slightly overestimate it. Anisotropy energy is calculated based on the anisotropy field and saturation magnetization for magnetic thin films. (C) 1999 American Institute of Physics. [S0021-8979(99)29508-4].