Citation
S. Yabukami et al., Noise analysis of a 1 MHz 3 GHz magnetic thin film permeance meter, J APPL PHYS, 85(8), 1999, pp. 5148-5150
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979
→ ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2A
Pages
5148 - 5150
Database
ISI
SICI code
0021-8979(19990415)85:8<5148:NAOA1M>2.0.ZU;2-3
Abstract
We analyzed the permeability measurement error of a low permeance thin film
. We clarified that the noise voltage was excited by a current loop which i
s composed of the coaxial cable and the ground plane. The current loop shou
ld be removed for high sensitivity of the permeameter. The permeability of
a high electrical resistivity film (CoFeHfO) has been demonstrated 1 MHz-3.
5 GHz. (C) 1999 American Institute of Physics. [S0021-8979(99)78908-5].