Electronic noise in magnetic tunnel junctions

Citation
S. Ingvarsson et al., Electronic noise in magnetic tunnel junctions, J APPL PHYS, 85(8), 1999, pp. 5270-5272
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
2A
Pages
5270 - 5272
Database
ISI
SICI code
0021-8979(19990415)85:8<5270:ENIMTJ>2.0.ZU;2-X
Abstract
We have studied bias and magnetic field dependence of voltage noise in meta llic magnetic tunnel junctions with areal dimensions on the order of 1 mu m . We generally observe noise with Gaussian amplitude distribution and pure 1/f power spectra at low frequencies. The 1/f noise scales with bias voltag e as V-2. Two kinds of deviations from this low frequency behavior have bee n observed. One is at fixed magnetic field when the junction bias reaches a bove a critical value, the other occurs at a fixed bias when the external m agnetic field brings the sample to certain magnetic configurations. In both cases the noise spectra become dominated by Lorentzian noise and in both c ases we have observed two level fluctuators in the time domain. We attribut e the bias dependent noise to charge traps in the tunnel barrier. The field dependent noise is associated with the switching of the magnetization dire ction of portions of the top electrode, which we believe to be reversible. (C) 1999 American Institute of Physics. [S0021-8979(99)49308-9].