Ion energy distributions and sheath voltages in a radio-frequency-biased, inductively coupled, high-density plasma reactor

Citation
Ma. Sobolewski et al., Ion energy distributions and sheath voltages in a radio-frequency-biased, inductively coupled, high-density plasma reactor, J APPL PHYS, 85(8), 1999, pp. 3966-3975
Citations number
54
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
85
Issue
8
Year of publication
1999
Part
1
Pages
3966 - 3975
Database
ISI
SICI code
0021-8979(19990415)85:8<3966:IEDASV>2.0.ZU;2-L
Abstract
Ion energy distributions were measured at a grounded surface in an inductiv ely coupled, high-density plasma reactor for pure argon, argon-helium, and argon-xenon discharges at 1.33 Pa (10 mTorr), as a function of radio-freque ncy (rf) bias amplitude, rf bias frequency, radial position, inductive sour ce power, and ion mass. The ground sheath voltage which accelerates the ion s was also determined using capacitive probe measurements and Langmuir prob e data. Together, the measurements provide a complete characterization of i on dynamics in the sheath, allowing ion transit time effects to be distingu ished from sheath impedance effects. Models are presented which describe bo th effects and explain why they are observed in the same range of rf bias f requency. [S0021-8979(99)03808-6].