In situ atomic force microscopy investigation of the growth of secondary nuclei produced by contact of different growth faces of potash alum crystalsunder supersaturated solutions

Citation
Mm. Reyhani et al., In situ atomic force microscopy investigation of the growth of secondary nuclei produced by contact of different growth faces of potash alum crystalsunder supersaturated solutions, J CRYST GR, 199, 1999, pp. 258-263
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
199
Year of publication
1999
Part
1
Pages
258 - 263
Database
ISI
SICI code
0022-0248(199903)199:<258:ISAFMI>2.0.ZU;2-X
Abstract
Contact of a potash alum crystal in a supersaturated solution with a solid surface may easily produce many secondary nuclei of the same orientation an d crystal structure as the parent crystal contact faces. Previous studies h ave shown that, if this contact is sufficiently gentle, secondary nuclei ma y be produced by the transfer of ordered solute molecules without the need for microabrasion of the parent solid. In this investigation, crystal faces of the {1 0 0}, {1 1 0}, and {1 1 1} families were identified in a parent crystal, and gentle contact between these and a solid surface (glass slide) in a slightly supersaturated solution of potash alum produced many seconda ry nuclei, the external symmetry of which reflected that of the parent face . In situ atomic force microscopy (AFM) measurements were carried out to st udy the early stages of the growth of these new nuclei. A strong correlatio n was found between the symmetry of the nuclei produced and that of the par ent crystal face. The topographies of the in situ growth of the (I 1 1) fac e of the parent crystal and those of the very small new nuclei produced wer e compared. (C) 1999 Elsevier Science B.V. All rights reserved.