Crystal growth, fabrication and evaluation of cadmium manganese telluride gamma ray detectors

Citation
A. Burger et al., Crystal growth, fabrication and evaluation of cadmium manganese telluride gamma ray detectors, J CRYST GR, 199, 1999, pp. 872-876
Citations number
11
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
199
Year of publication
1999
Part
1
Pages
872 - 876
Database
ISI
SICI code
0022-0248(199903)199:<872:CGFAEO>2.0.ZU;2-W
Abstract
Cadmium manganese telluride (Cd1-xMnxTe) is a diluted magnetic semiconducto r material which forms the basis for many important devices such as IR dete ctors, solar cells, magnetic field sensors, optical isolators, and visible and near IR lasers. High resistivity ( > 10(10) Omega cm) and high mu tau ( > 10(-6) cm(2)/V) material, which are the two prerequisites in the fabrica tion of radiation detectors, has recently been demonstrated at Brimrose Cor p. This paper presents the crystal growth of intentionally vanadium doped c rystals, the surface preparation and contacting procedure, as well as the b est detector performance obtained so far. Dark current characteristics, and low temperature photoluminescence results are also presented and discussed . (C) 1999 Elsevier Science B.V. All rights reserved.