THICKNESS EFFECT ON PHOTOCONDUCTION SPECTRA IN SOLID FILMS OF C-60

Citation
G. Giro et al., THICKNESS EFFECT ON PHOTOCONDUCTION SPECTRA IN SOLID FILMS OF C-60, Synthetic metals, 86(1-3), 1997, pp. 2339-2340
Citations number
2
Categorie Soggetti
Physics, Condensed Matter","Material Science","Polymer Sciences
Journal title
ISSN journal
03796779
Volume
86
Issue
1-3
Year of publication
1997
Pages
2339 - 2340
Database
ISI
SICI code
0379-6779(1997)86:1-3<2339:TEOPSI>2.0.ZU;2-E
Abstract
Steady-state photoconductivity action spectra in the wavelength range between 200 and 800 nm have been measured in C-60 formed vacuum evapor ated films of different thickness. The photoconduction can be describe d by the interplay between two charge generation mechanisms : auto-ion ization of excited states in the bulk, accompained by excitonic inject ion of electrons from the Al cathode. The thickness of the films reduc es the negative-to-positive photocurrent ratio in the strongest absorp tion region.