Z. Ashitaka et al., The behavior of copper and lead during heat-treatment and surface treatment of aluminium capacitor, J ELCHEM SO, 146(4), 1999, pp. 1380-1385
The influences of heat-treatment. electropolishing, etching, and anodizing
treatments, applied individually or in combination. on the distributions of
copper and lead in aluminum capacitor foils have been investigated for foi
ls of 100 mu m thickness, containing up to 100 ppm copper and 1.5 ppm lead.
The selected heat-treatment re-suits in major redistribution of lead in th
e bulk foils, with a comparatively small effect upon the distribution of co
pper Importantly, the lead segregates to a metal layer, probably of about 1
-2 nm thickness, located immediately beneath the thermally formed oxide fil
m. The enrichments of lead developed by the heat-treatment am largely retai
ned in the metal surface region during etching and subsequent anodizing tre
atments. In contrast. electropolishing results in extensive loss of the seg
regated lead from the foil surfaces to the electropolishing electrolyte, wh
ich is attributed to transient localized corrosion of the metal in the elec
tropolishing bath. Enrichments of copper am developed during electropolishi
ng, etching, and anodizing treatments, with the possibility of incorporatio
n of copper species into the associated oxide films. (C) 1999 The Electroch
emical Society. S0013-4651(98)07-065-7. All rights reserved.