A semiconductor laser model is presented, which resolves the full time
, longitudinal and lateral space dependences, The model is applied to
an investigation of the dynamical stability of an integrated master-os
cillator power-amplifier (MOPA) device. The model captures the full ga
in and refractive index bandwidth as a function of total carrier densi
ty, Our simulation confirms, for the first time, some recent experimen
tal observations of high frequency whole beam oscillations and experim
ental reports that complex transverse filamentation occurs at high pow
er amplifier currents.