F. Legall et al., MODAL CHARACTERIZATION USING BRAGG GRATINGS IN PHOTOSENSITIVE SIO2-SISTRIP WAVE-GUIDES, IEEE photonics technology letters, 9(6), 1997, pp. 788-790
New methods for modal characterization of silica waveguides using UV-i
nduced Bragg gratings are proposed. These methods rely either on the f
iltering of the fundamental optical mode with a Bragg filter or on the
mode coupling by tilting the Bragg grating relative to the optical ax
is. Both theoretical and experimental results are reported in this pap
er.