A scanning tunneling microscopy study of the GaAs(112) surfaces

Citation
L. Geelhaar et al., A scanning tunneling microscopy study of the GaAs(112) surfaces, MICROELEC J, 30(4-5), 1999, pp. 393-396
Citations number
16
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
30
Issue
4-5
Year of publication
1999
Pages
393 - 396
Database
ISI
SICI code
0026-2692(199904/05)30:4-5<393:ASTMSO>2.0.ZU;2-O
Abstract
The GaAs(112)A and B surfaces were prepared by molecular beam epitaxy (MBE) and characterized in situ by scanning tunneling microscopy (STM). Both sur faces an unstable. On the (112)A surface Eve facets with the orientations ( 111), {110} and {124} appear, while on the ((112) over bar)B surface four f acets with the orientations ((111) over bar)B, ((110) over bar) and ((113) over bar)B were observed. In both cases, the facets form depressions coveri ng the entire surface. In addition, total-energy calculations employing den sity-functional theory were carried out for these surfaces. For the (112)A surface a roof-like structure of {111} and {113} planes has the lowest calc ulated energy. According to the calculations, the ((112) over bar)B surface forms under As-rich conditions a roof-like structure of {(111) over bar} a nd {(113) over bar}B planes, and it decomposes under Ga-rich conditions int o {<(11)over bar>0} planes. The experimental and theoretical findings for t he {(112) over bar}B surface are in good agreement. The occurrence of {124} -facets on the (112)A surface was not taken into consideration in the calcu lations and needs to be investigated further. (C) 1999 Elsevier Science Ltd . All rights reserved.