Morphological instabilities during homoepitaxy on vicinal GaAs(110) surfaces

Citation
P. Tejedor et al., Morphological instabilities during homoepitaxy on vicinal GaAs(110) surfaces, MICROELEC J, 30(4-5), 1999, pp. 477-482
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS JOURNAL
ISSN journal
00262692 → ACNP
Volume
30
Issue
4-5
Year of publication
1999
Pages
477 - 482
Database
ISI
SICI code
0026-2692(199904/05)30:4-5<477:MIDHOV>2.0.ZU;2-K
Abstract
Growth of GaAs by molecular beam epitaxy on (110) substrates vicinal to (11 1)A has been systematically studied by atomic force and Nomarski microscopy at different As/Ga flux ratios, substrate temperatures and growth rates. D epending on the growth conditions, a striking variety of morphological inst abilities have been found that range from step bunching in the Ga-supply li mited regime to creation of long-range, well-ordered patterns of three-dime nsional pyramidal features on the surface under As-deficient conditions. We discuss the microscopic origin of the morphological instabilities and self -organization of the surface features in terms of growth modes, relative ad atom populations and step-attachment probabilities. (C) 1999 Elsevier Scien ce Ltd. All rights reserved.