Near-field scanning optical microscopy of nanostructures

Authors
DeAro, JA Weston, KD Buratto, SK
Citation
Ja. Dearo et al., Near-field scanning optical microscopy of nanostructures, PHASE TRAN, 68(1), 1999, pp. 27-57
Citations number
60
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHASE TRANSITIONS
ISSN journal
01411594 → ACNP
Volume
68
Issue
1
Year of publication
1999
Part
B
Pages
27 - 57
Database
ISI
SICI code
0141-1594(1999)68:1<27:NSOMON>2.0.ZU;2-Z
Abstract
The applications of near-field scanning optical microscopy (NSOM) to variou s nanostructured materials are reviewed. The review begins with a descripti on of experimental aspects of NSOM and the various contrast mechanisms avai lable with the technique. Applications of NSOM to a variety of different ma terials are then addressed including: NSOM of semiconductor heterostructure s, NSOM of polymers and molecular crystals, and NSOM of Langmuir-Blodgett f ilms and layered organic self-assemblies.