We report on photoluminescence excitation (PLE) studies of defect luminesce
nce in SiC. Two examples are given illustrating the main advantages of the
technique. First, the benefits of selective excitation are shown in sorting
out a complicated PL spectrum in electron irradiated 4H-SiC. Secondly, the
possibility of detecting high energy excited states is demonstrated by the
PLE spectrum of the D-1 centre in 4H-SiC