In this paper we have used the simple model for In segregation presented by
Muraki et al. [Appl. Phys. Lett. 61, 557 (1992)] to calculate the profiles
for In content in a series of InxGa1-xAs/GaAs MQWs. The resulting potentia
l profiles were calculated, and the envelope function approximation was use
d in a transfer matrix formalism, to calculate transition energies and over
lap integrals. Photoluminescence excitation spectroscopy (PLE) spectra were
calculated, and their variation with the amount of In segregation was inve
stigated. We found that while the confined levels shift towards higher ener
gies, the above-barrier levels shift in the opposite direction, resulting i
n that the calculated PLE spectra "contract" around similar to 1.51 eV. We
also measured the PLE spectra of two samples grown at different temperature
s and used the segregation ratio R as a fitting parameter. For the sample g
rown at similar to 500 degrees C we found that less than 80% of the impingi
ng In atoms segregate, while for the sample grown at similar to 520 degrees
C the fitted R is 93% when no re-evaporation of the In atoms was assumed.