Infrared pixel detectors sensitive to radiation in the wavelength range 8 t
o 9 mu m have been fabricated and evaluated. The detectors have 320 x 240 p
ixels and consist of two parts. One is the infrared sensitive part with a q
uantum well structure based on n-doped AlGaAs/GaAs. The other part is a rea
dout circuit in standard CMOS technology. The two parts are hybridized by a
flip-chip technique using indium bumps.
Optical coupling into the detectors is performed by using optimized, etched
, two-dimensional gratings combined with GaAs substrate thinning down The t
hinning removes the problem with thermal mismatch, enhances the absorption
and eliminates optical crosstalk between pixels. The intended operating tem
perature range is 70-73 K, achievable by a miniature Stirling cooler. Excel
lent wafer uniformities resulting in responsivity uniformities of 3.3% acro
ss an array are found, and a temperature resolution NETD (noise equivalent
temperature difference) = 20 mK is achieved.