The electroless deposition of Cu was carried out with aqueous solutions con
taining either Pd2+ or Mg2+ ions. The substrate was SiO2 with a TiN/Ti adhe
sion Layer. Copper obtained from electroless deposition had smaller grains,
a higher impurity level (Ti CZ S, Na and Pd) and a higher resistivity than
Cu deposited by sputtering. After electroless deposition of Cu with Pd2+ i
ons, the sample's were submitted to a heat treatment in Ar at 500 degrees C
. The annealed Cu films had a lower impurity content (Ti, C and S), larger
grains as well as a lower resistivity. Copper films obtained by electroless
deposition with Mg2+ ions presented a very high O content, a small grain s
tructure as well as a high resistivity. Furthermore, the higher the Mg conc
entration was in the aqueous solution, the higher was the O level in the Cu
and the higher was the resistivity. The Cu resistivity was found to be str
ongly dependent on the Cu grain size and O content.