Electroless deposition of Cu with solutions containing either Mg2+ or Pd2+ions

Citation
A. Mouroux et al., Electroless deposition of Cu with solutions containing either Mg2+ or Pd2+ions, PHYS SCR, T79, 1999, pp. 232-235
Citations number
4
Categorie Soggetti
Physics
Journal title
PHYSICA SCRIPTA
ISSN journal
02811847 → ACNP
Volume
T79
Year of publication
1999
Pages
232 - 235
Database
ISI
SICI code
0281-1847(1999)T79:<232:EDOCWS>2.0.ZU;2-X
Abstract
The electroless deposition of Cu was carried out with aqueous solutions con taining either Pd2+ or Mg2+ ions. The substrate was SiO2 with a TiN/Ti adhe sion Layer. Copper obtained from electroless deposition had smaller grains, a higher impurity level (Ti CZ S, Na and Pd) and a higher resistivity than Cu deposited by sputtering. After electroless deposition of Cu with Pd2+ i ons, the sample's were submitted to a heat treatment in Ar at 500 degrees C . The annealed Cu films had a lower impurity content (Ti, C and S), larger grains as well as a lower resistivity. Copper films obtained by electroless deposition with Mg2+ ions presented a very high O content, a small grain s tructure as well as a high resistivity. Furthermore, the higher the Mg conc entration was in the aqueous solution, the higher was the O level in the Cu and the higher was the resistivity. The Cu resistivity was found to be str ongly dependent on the Cu grain size and O content.