A capacitive silicon microphone has been fabricated. The component consists
of two freestanding polysilicon membranes, a low-stress bending membrane a
nd a high-stress backplate, which are separated by an air gap. Sound pressu
re changes the capacitance between the membranes. A back-chamber is arrange
d by encapsulation and static pressure changes are prevented with small equ
alisation holes in the bending membrane. The: component is fabricated combi
ning bulk and surface micromachining techniques. Silicon substrates are etc
hed in TMAH and sacrificial oxide between the membranes is etched in PSG-et
ch followed by freeze drying to prevent sticking. The measured acoustic sen
sitivity of the microphone with 1 x 1 mm(2) membrane was 2mV/Pa (1 kHz freq
uency) and the resolution 35 dB (A-weighted sound level).