Capacitive silicon microphone

Citation
A. Torkkeli et al., Capacitive silicon microphone, PHYS SCR, T79, 1999, pp. 275-278
Citations number
8
Categorie Soggetti
Physics
Journal title
PHYSICA SCRIPTA
ISSN journal
02811847 → ACNP
Volume
T79
Year of publication
1999
Pages
275 - 278
Database
ISI
SICI code
0281-1847(1999)T79:<275:CSM>2.0.ZU;2-H
Abstract
A capacitive silicon microphone has been fabricated. The component consists of two freestanding polysilicon membranes, a low-stress bending membrane a nd a high-stress backplate, which are separated by an air gap. Sound pressu re changes the capacitance between the membranes. A back-chamber is arrange d by encapsulation and static pressure changes are prevented with small equ alisation holes in the bending membrane. The: component is fabricated combi ning bulk and surface micromachining techniques. Silicon substrates are etc hed in TMAH and sacrificial oxide between the membranes is etched in PSG-et ch followed by freeze drying to prevent sticking. The measured acoustic sen sitivity of the microphone with 1 x 1 mm(2) membrane was 2mV/Pa (1 kHz freq uency) and the resolution 35 dB (A-weighted sound level).