The RF simulation properties of four mainstream CMOS models were evaluated:
Level 3 [1], EKV [2], Philips MOS Model 9 [3], BSIM3v3 [4]. The goal has b
een to compare the RF properties of these four models. Level 3 model was ma
inly chosen to be a reference. Frequencies of interest range from 300 MHz t
o 10 GHz. In order to get more realistic AC results a gate resistor was add
ed to EKV,MOS Model 9 and BSIM3v3. Also non-aquasi-static (NQS) operation h
as been considered for BSIM3v3. The work has been done by extracting model
parameters for each model. Extraction has been done by fitting simulated re
sults to measured ones. 18 RF test transistors with varying widths, lengths
down to 0.4 mu m and a number of parallel devices were processed in VTT Bi
CMOS technology. Additional 12 test transistors were needed for DC measurem
ents. General optimization algorithms and sequential extraction steps have
been used in the fitting. All extractions have been done by using the APLAC
circuit simulator [5] and by programs [6] written in APLAC description lan
; guage. The MOS transistor was studied as a two-port shown in Pig. 1.