A 2.0 mu m cutoff wavelength separate absorption, charge, and multiplication layer avalanche photodiode using strain-compensated InGaAs quantum wells

Citation
Jc. Dries et al., A 2.0 mu m cutoff wavelength separate absorption, charge, and multiplication layer avalanche photodiode using strain-compensated InGaAs quantum wells, APPL PHYS L, 74(18), 1999, pp. 2581-2583
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
18
Year of publication
1999
Pages
2581 - 2583
Database
ISI
SICI code
0003-6951(19990503)74:18<2581:A2MMCW>2.0.ZU;2-W
Abstract
We report an avalanche photodiode structure for use at wavelengths as long as 2.1 mm. Light is absorbed in a 100 period structure consisting of In0.83 Ga0.17As quantum wells strain compensated by In0.83Ga0.17P barrier layers. Photogenerated electrons are injected into a high field In0.52Al0.48As (ion ization rate ratio=0.2) gain region initiating low noise avalanche multipli cation. Primary dark currents of similar to 5 nA and responsivities of 45 A /W at a wavelength of 1.9 mu m are observed. (C) 1999 American Institute of Physics. [S0003-6951(99)03118-6].