Quantum box size effect on vertical self-alignment studied using cross-sectional scanning tunneling microscopy

Citation
B. Legrand et al., Quantum box size effect on vertical self-alignment studied using cross-sectional scanning tunneling microscopy, APPL PHYS L, 74(18), 1999, pp. 2608-2610
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
18
Year of publication
1999
Pages
2608 - 2610
Database
ISI
SICI code
0003-6951(19990503)74:18<2608:QBSEOV>2.0.ZU;2-E
Abstract
InAs quantum boxes separated by GaAs spacer layers are known to exhibit a v ertical self-organization along the growth direction. The alignment probabi lity between two sets of quantum boxes depends strongly on the spacer layer thickness Zs. In this letter, we study samples containing multiple arrays of quantum boxes separated by GaAs spacer layers of various thicknesses, us ing cross-sectional scanning tunneling microscopy. This work experimentally evidences that the spacer layer characteristic thickness Zs(0) below which a vertical self-alignment occurs, depends on the size of the quantum boxes . These results are interpreted using a theoretical two-dimensional model. (C) 1999 American Institute of Physics. [S0003-6951(99)03618-9].