Atomic force microscopy of work functions on the nanometer scale

Citation
Mp. O'Boyle et al., Atomic force microscopy of work functions on the nanometer scale, APPL PHYS L, 74(18), 1999, pp. 2641-2642
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
74
Issue
18
Year of publication
1999
Pages
2641 - 2642
Database
ISI
SICI code
0003-6951(19990503)74:18<2641:AFMOWF>2.0.ZU;2-T
Abstract
The Kelvin probe force microscope, introduced some years ago, has opened up several avenues of investigation. In this letter, we demonstrate that the technique is capable of distinguishing constituents of a metal alloy throug h their work-function differences. The intermetallics in the alloy are clea rly resolved. We discuss the basic principles of the measurement technique and present our results on aluminum/copper surfaces. The limits of the tech nique are also discussed. (C) 1999 American Institute of Physics. [S0003-69 51(99)04117-0].