T. Kimura et al., Surface-induced dissociation of lanthanum metallofullerenes on a fluorinated self-assembled monolayer film, CHEM P LETT, 304(3-4), 1999, pp. 211-216
Surface-induced dissociation (STD) of purified La@C-82 on a fluorinated sel
f-assembled monolayer (F-SAM) film has been studied by a reflectron-type ti
me-of-flight mass spectrometer modified for measuring SID spectra. Lanthanu
m-containing fragments LaCn+ formed as a result of sequential C-2-loss proc
esses have been observed. No lanthanum-stripping fragmentation was observed
, up to 160 eV collision energies. The SID of LaC60 on the F-SAM film has a
lso been investigated up to 100 eV collision energies. The SID profiles of
LaC60 are similar to those of La@C-82 which strongly suggests that La@C-60,
like La@C-82, has an endohedral structure. (C) 1999 Elsevier Science B.V.
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