Image sensors in thin film on ASIC (TFA) technology are composed of amorpho
us silicon (a-Si:H) thin-film detectors on top of crystalline ASIC's. With
regard to advanced imaging systems, TFA provides enhanced performance and m
ore flexibility than conventional technologies. Extensive an-chip signal pr
ocessing is feasible, as well as small pixels for high-resolution imagers.
Several prototypes of TPA sensors have been developed, optimized for consid
erably different applications. This paper focuses on a TFA sensor for autom
otive vision systems that allows each pixel to adapt its individual sensiti
vity to the local illumination intensity. By this means, a dynamic range of
120-dB minimum along with high local contrast is achieved. The recent seco
nd prototype array consists of 368 x 256 pixels with an area of 40 x 38 mu
m(2) each. The ASIC's were fabricated in a 0.7-mu m CMOS technology, whereu
pon the a-Si:H thin film was deposited in a plasma-enhanced chemical vapor
deposition cluster system.