Diffuse X-ray scattering by 2,3-dimethylnaphthalene

Citation
R. Schreier et J. Kalus, Diffuse X-ray scattering by 2,3-dimethylnaphthalene, J APPL CRYS, 32, 1999, pp. 309-321
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF APPLIED CRYSTALLOGRAPHY
ISSN journal
00218898 → ACNP
Volume
32
Year of publication
1999
Part
2
Pages
309 - 321
Database
ISI
SICI code
0021-8898(19990401)32:<309:DXSB2>2.0.ZU;2-N
Abstract
The diffuse intensity distribution of X-rays scattered from a dipolar disor dered single crystal of 2,3-dimethylnaphthalene (2,3-DMN) has been measured and was found to be nearly independent of temperature in some restricted r egions of the reciprocal space. This behaviour was related to a static diso rder of the crystal. Lattice parameters were determined between room temper ature and 9 K and phase transitions at 227 K and 112 K were observed. The r esults of the data analysis at 298 K are: the equivalent isotropic displace ment parameter U-eq for the thermal Debye-Waller factor is (0.18 Angstrom)( 2) the displacement parameters describing the static disorder are U-xx(C) l ess than or equal to (0.05 Angstrom)(2), U-yy(C) = [0.22 (2) Angstrom](2) a nd U-zz(C) = [0.35 (3) Angstrom](2). The molecules show an orientational Ga ussian distribution around the x axis with a width of 5.0 (8)degrees. All t hese results refer to the molecular inertia system. Correlation coefficient s characterizing the mean mutual orientation of neighbouring molecules were determined. The highest correlation coefficient was found along [010]: C = -0.231 +/- 0.004.