UMWEG-XX was designed as a software tool for taking into account multiple d
iffraction effects in many areas of crystal structure analysis. The UMWEG-9
8 version of the program makes possible the calculation and graphical repre
sentation of multiple diffraction patterns (Renninger scans, multiple diffr
action peak location plots) of forbidden and weak reflections and can be ap
plied to synchrotron as well as K alpha(1,2) radiation. The program is writ
ten in standard Fortran90 and may be ported to Unix platforms, such as HP,
Sun, Silicon Graphics and TBM, as well as to DOS and Windows platforms. The
program runs without any commercial subroutine libraries. Consequently it
can be used without licence problems. A current version is distributed via
http://www.rrz.uni-hamburg.de/mpi/rossmanith. Executable (binary) files are
available free of charge for academic use only.