High-precision assessment of interface lattice offset by quantitative HRTEM

Authors
Schweinfest, R Ernst, F Wagner, T Ruhle, M
Citation
R. Schweinfest et al., High-precision assessment of interface lattice offset by quantitative HRTEM, J MICROSC O, 194, 1999, pp. 142-151
Citations number
32
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF MICROSCOPY-OXFORD
ISSN journal
00222720 → ACNP
Volume
194
Year of publication
1999
Part
1
Pages
142 - 151
Database
ISI
SICI code
0022-2720(199904)194:<142:HAOILO>2.0.ZU;2-#
Abstract
We introduce a new method to determine the 'lattice offset' or 'rigid-body shift' between two crystals forming an interface. Our method relies on quan titative evaluation of high-resolution transmission electron microscopy ima ges. Employing the (001)-orientated interface between Al and MgAl2O4 in par allel orientation as a model system we demonstrate that we can assess the i nterface lattice offset with a precision in the picometre range.