Infra-red, electron paramagnetic resonance and x-ray photoemission spectral properties of point defects in silica from first-principle calculations

Citation
G. Pacchioni et M. Vitiello, Infra-red, electron paramagnetic resonance and x-ray photoemission spectral properties of point defects in silica from first-principle calculations, J NON-CRYST, 245, 1999, pp. 175-182
Citations number
37
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF NON-CRYSTALLINE SOLIDS
ISSN journal
00223093 → ACNP
Volume
245
Year of publication
1999
Pages
175 - 182
Database
ISI
SICI code
0022-3093(19990401)245:<175:IEPRAX>2.0.ZU;2-H
Abstract
First-principle calculations based on cluster models have been performed to compute the observable electronic properties of a series of dia- and param agnetic point defects in SiO2. Vibrational modes, hyperfine coupling consta nts, and core level binding energies have been determined at the Hartree-Fo ck and gradient corrected density functional theory levels and compared wit h the experimental infra-red, electron paramagnetic resonance and X-ray pho toemission spectral features, when available. The results show the potentia l of the combined use of quantum mechanical calculations and spectroscopic measurements for the structural description of point defects in silica. (C) 1999 Elsevier Science B.V. All rights reserved.