Femtosecond IR study of excited-state relaxation and electron-injection dynamics of Ru(dcbpy)(2)(NCS)(2) in solution and on nanocrystalline TiO2 and Al2O3 thin films
Jb. Asbury et al., Femtosecond IR study of excited-state relaxation and electron-injection dynamics of Ru(dcbpy)(2)(NCS)(2) in solution and on nanocrystalline TiO2 and Al2O3 thin films, J PHYS CH B, 103(16), 1999, pp. 3110-3119
The photophysics and electron injection dynamics of Ru(dcbpy)(2)(NCS)(2) [d
cbpy = (4,4'-dicarboxy-2,2'-bipyridine)] (or Ru N3) in solution and adsorbe
d on nanocrystalline Al2O3 and TiO2 thin films were studied: by femtosecond
mid-IR spectroscopy. For Ru N3 in ethanol after 400 nm excitation, the lon
g-lived metal-to-ligand charge transfer ((MLCT)-M-3) excited state with CN
stretching bands at 2040 cm(-1) was formed in less than 100 fs. No further
decay of the excited-state absorption was observed within 1 ns consistent w
ith the previously known 59 ns lifetime. For Ru N3 absorbed on Al2O3, an in
sulating substrate, the 3MLCT state was also formed in less than 100 fs. In
contrast to Ru N3 in ethanol, this:excited state decayed by 50% within 1 n
s via multiple exponential decay while no ground-state recovery was observe
d. This decay is attributed to electron transfer to surface states in the b
and gap of Al2O3 nanoparticles. For Ru N3 adsorbed onto the surface of TiO2
, the transient mid-IR signal was dominated by the TR absorption of injecte
d electrons in TiO2 in the 1700-2400 cm(-1) region. The rise time of the IR
signal can be fitted by biexponential rise functions: 50 +/- 25 fs(>84%) a
nd 1.7 +/- 0.5 ps (<16%) after deconvolution of instrument response functio
n determined in a thin silicon wafer. Because of the scattering of the pump
photon in the porous TiO2 thin film, the instrument response may be slight
ly lengthened, which may require a faster rise time for the first component
to fit the data. The first component is assigned to the electron injection
from the Ru N3 excited state to TiO2. The amplitude of the slower componen
t appears to vary with samples ranging from ca. 16% in new samples to <5% i
n aged samples. The subsequent dynamics of the injected electrons have also
been monitored by the decay of the IR signal. The observed 20% decay in am
plitude within 1 ns was attributed to electron trapping dynamics in the thi
n films.