This paper reviews advanced techniques of transmission electron microscopy
(TEM) to study the structure, composition, and charge distribution at inter
faces in ceramics. Recent experimental studies on grain boundaries in lead
titanate, silicon nitride, and strontium titanate serve as examples to demo
nstrate the advantages TEM in obtaining structural and chemical information
at high spatial resolution. (C) 1999 Elsevier Science Limited. All rights
reserved.