Chemical route to ferroelectric thin film capacitors

Citation
Jp. Mercurio et al., Chemical route to ferroelectric thin film capacitors, J EUR CERAM, 19(6-7), 1999, pp. 1439-1442
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY
ISSN journal
09552219 → ACNP
Volume
19
Issue
6-7
Year of publication
1999
Pages
1439 - 1442
Database
ISI
SICI code
0955-2219(1999)19:6-7<1439:CRTFTF>2.0.ZU;2-P
Abstract
For the first time the fabrication of ferroelectric SrBi2(Ta,Nb)(2)O-9 thin film capacitors with RuO2 electrodes is conducted using a full chemical ro ute. SrBi2(Ta,Nb)(2)O-9 sols were obtained from niobium and tantalum ethoxi des mixed with bismuth and strontium 2-ethylhexanoates. RuO2 sols were prep ared by dissolving an aqueous solution of ruthenium nitrosylnitrate into 2- methoxyethanol. Capacitors were fabricated by spin coating the precursor so lutions on silicon wafers according to the Si/RuO2/ SrBi2(Ta,Nb)(2)O-9/RuO2 sequence. Fully crystallized crack-free materials (RuO2 and SrBi2(Ta,Nb)(2 )O-9) were obtained bq, annealing at 700 degrees C for 2 h. Hysteresis loop s (3-10 V) are similar to those observed using platinum electrodes. (C) 199 9 Elsevier Science Limited. All rights reserved.