Multilayer structural determination of the GaAs((1)over-bar(1)over-bar(1)over-bar)2x2 reconstruction by automated tensor LEED

Citation
Bc. Deng et al., Multilayer structural determination of the GaAs((1)over-bar(1)over-bar(1)over-bar)2x2 reconstruction by automated tensor LEED, PHYS REV B, 59(15), 1999, pp. 9775-9778
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
59
Issue
15
Year of publication
1999
Pages
9775 - 9778
Database
ISI
SICI code
0163-1829(19990415)59:15<9775:MSDOTG>2.0.ZU;2-3
Abstract
The multilayer atomic coordinates for the GaAs((1) over bar (1) over bar (1 ) over bar)(2 x2) surface have been determined using automated tensor low-e nergy electron diffraction. The results confirm the As adatom trimer model found by total-energy calculations and scanning tunneling microscopy studie s although details of the displacements are different. The low-energy elect ron diffraction analysis, being sensitive to multilayer spacings in the sur face region, shows that substantial subsurface relaxations are present. [S0 163-1829(99)15115-4].