Jx. Gao et al., Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-delta/LaAlO3ferroelectric capacitors, RADIAT EFF, 145(4), 1998, pp. 319-327
PbZr0.52Ti0.48O3/YBa2Cu3O7-delta (PZT/YBCO) thin films have been fabricated
on LaAlO3 substrate by the pulsed laser excimer deposition method. In orde
r to investigate total dose radiation effects by Co-60 gamma-irradiation on
the Au/PZT/YBCO ferroelectric capacitor, the capacitance-voltage (C-V) and
the retained polarization properties of the capacitor were measured before
and after gamma-ray irradiation. The results showed that, with the increme
nt of the total dose, the retained polarization (Delta P) and the dielectri
c constant (epsilon) decreased, but the absolute value of the negative and
positive coercitive fields increased. It is due to the effect of charges tr
apped by defects in the PZT capacitor during irradiation.