Growth behavior and surface morphology of Ag rough thin films deposited onsilicone oil surfaces

The growth behavior and surface morphology of a rough film system, deposite d on silicone oil drop surfaces by a r.f. magnetron sputtering method, have been studied. An anomalous film growth relaxation is observed during the d eposition process. The relaxation rate is extremely sensitive to the substr ate temperature. The surface morphology at the micrometer length scale is v ery susceptible to the substrate temperature, the incident r.f. capacity, a nd the nature of the solid substrate on which the oil drop is dripped. A di scussion on the physical origins of these phenomena is also presented. (C) 1999 Elsevier Science S.A. All rights reserved.