The high-angle hollow cone illumination realized in a conventional transmis
sion microscope is known to suppress coherent contrast mechanisms. It is sh
own that under suitable experimental conditions, orientation and strain con
trasts are sufficiently suppressed to obtain a Z-contrast image. Various fa
ctors, influencing the image intensity, are determined by a quantitative im
age analysis of pure metals. Based on these measurements an incoherent mult
iscattering model is generalized to binary alloys in order to describe the
chemical image contrast and to determine the local composition of the speci
men from an intensity measurement. To test the concept, the early stages of
interdiffusion between thin films of Cu and Au are investigated. The resul
ts demonstrate that a useful chemical analysis is possible, even in the cas
e of nanocrystalline specimens. Complete composition profiles are determine
d on a length scale of 10 nm. The spatial and chemical resolution of the me
thod are discussed. (C) 1999 Elsevier Science B.V. All rights reserved.