Scanning probe microscopy study of the interface roughness dependence of the magnetism of metallic multilayers

Authors
Eilers, G Yamada, Y Matsui, M Mukasa, K
Citation
G. Eilers et al., Scanning probe microscopy study of the interface roughness dependence of the magnetism of metallic multilayers, APPL SURF S, 142(1-4), 1999, pp. 527-531
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
142
Issue
1-4
Year of publication
1999
Pages
527 - 531
Database
ISI
SICI code
0169-4332(199904)142:1-4<527:SPMSOT>2.0.ZU;2-H
Abstract
In magnetic metallic multilayers and thin films the roughness at the interf ace of the non-magnetic and the magnetic layers is an important factor to d etermine their magnetic properties. In this work we present a combined stud y of reflection high-energy electron diffraction (RHEED) and scanning tunne ling microscope (STM) observations of epitaxially grown Fe/Cu(001) multilay ers. For a Fe layer thickness of about six monolayers in a 20-period multil ayer a strong dependence of the magnetization on the surface roughness was found. A rough surface leads to a higher saturation magnetization. (C) 1999 Elsevier Science B.V. All rights reserved.