Deep level energy states in porous silicon and porous silicon carbide determined by space-charge-limited current measurements

Citation
T. Matsumoto et al., Deep level energy states in porous silicon and porous silicon carbide determined by space-charge-limited current measurements, APPL SURF S, 142(1-4), 1999, pp. 569-573
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
142
Issue
1-4
Year of publication
1999
Pages
569 - 573
Database
ISI
SICI code
0169-4332(199904)142:1-4<569:DLESIP>2.0.ZU;2-J
Abstract
We determined the density of states distribution near the Fermi level both fox porous silicon (PS) and for porous silicon carbide (PSC) from the analy sis of the current-voltage (J-V) characteristics in the space-charge-limite d current (SCLC) regime. The distribution of deep level energy states of PS can be described by a stretched exponential function, whereas that of PSC exhibits a simple exponential shape. Theoretical analysis well explains the J-V characteristics of both porous materials, which suggests that the curr ent flow is entirely controlled by localized states situated at the quasi-F ermi level. (C) 1999 Elsevier Science B.V. All rights reserved.