TEM characterization of cellulose Langmuir-Blodgett films

Citation
S. Kimura et al., TEM characterization of cellulose Langmuir-Blodgett films, APPL SURF S, 142(1-4), 1999, pp. 579-584
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
APPLIED SURFACE SCIENCE
ISSN journal
01694332 → ACNP
Volume
142
Issue
1-4
Year of publication
1999
Pages
579 - 584
Database
ISI
SICI code
0169-4332(199904)142:1-4<579:TCOCLF>2.0.ZU;2-I
Abstract
We have investigated the temperature dependence of the micro-structure of p almitoyl cellulose Langmuir-Blodgett film by high resolution transmission e lectron microscope (TEM). The existence of the well-defined solid-like stat e at temperatures lower than 303 K, and the deformed solid-like state at te mperatures higher than 303 K have been examined by (d pi/dA) value. The ave rage grain size of about 200 nm has been observed at lower subphase tempera tures and the size decreased with the increase of temperature up to the tra nsition temperature of 303 K, and the size of deformed solid-film state inc reased with further increase of subphase temperature. (C) 1999 Elsevier Sci ence B.V. All rights reserved.