A. Girardot et al., High-performance collector-up InGaP/GaAs heterojunction bipolar transistorwith Schottky contact, ELECTR LETT, 35(8), 1999, pp. 670-672
The first fabrication and RF characterisation of an InGaP/GaAs single heter
ojunction bipolar transistor in collector-up topology with Schottky contact
are reported. Boron implantation is employed to prevent current injection
into the extrinsic base region. Realised devices exhibit F-MAX = 110GHz and
breakdown voltage BVCEO = 16V. The RF gain of these components appears to
be less sensitive to HBT development than standard emitter-up HBTs.