Transfer of GaSb thin film to insulating substrate via separation by hydrogen implantation

Citation
Kd. Hobart et Fj. Kub, Transfer of GaSb thin film to insulating substrate via separation by hydrogen implantation, ELECTR LETT, 35(8), 1999, pp. 675-676
Citations number
9
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
35
Issue
8
Year of publication
1999
Pages
675 - 676
Database
ISI
SICI code
0013-5194(19990415)35:8<675:TOGTFT>2.0.ZU;2-0
Abstract
Thin films of GaSb were transferred to insulating substrates by a combinati on of wafer bonding and separation by hydrogen ion implantation. Hydrogen i on implantation and exfoliation were successfully exploited to transfer a 2 40nm thick GaSb film to a glass substrate at temperatures less than or equa l to 150 degrees C. A novel room temperature wafer bonding technique utilis ing an ultraviolet/ozone process was also demonstrated. The films have been characterised by atomic force and scanning electron microscopies.