Determination of the Se atom distribution in the layered compound Nb-3(Se1-xIx)I-7 by scanning tunneling microscopy

Authors
Schmidt, PJ Thiele, G Whangbo, MH
Citation
Pj. Schmidt et al., Determination of the Se atom distribution in the layered compound Nb-3(Se1-xIx)I-7 by scanning tunneling microscopy, EUR J INORG, (5), 1999, pp. 785-787
Citations number
25
Categorie Soggetti
Inorganic & Nuclear Chemistry
Journal title
EUROPEAN JOURNAL OF INORGANIC CHEMISTRY
ISSN journal
14341948 → ACNP
Issue
5
Year of publication
1999
Pages
785 - 787
Database
ISI
SICI code
1434-1948(199905):5<785:DOTSAD>2.0.ZU;2-8
Abstract
The layered compound Nb-3(Se1-xIx)I-7 is obtained when the I of the Se atom s in Nb-3(Se1-xIx)I-7 were examined by scanning atoms at the face-capping s ites of the layered compound tunneling microscopy. The analysis shows that the Nb3I8 are replaced by Se atoms. The amount and distribution distributio n of the Se atoms is completely random.